Electrical Computer Engineering - ECE

ECE 157A - Machine Learning in Design and Test Automation

Introduces the various machine learning techniques and how they are utilized to improve hardware design and test automation processes. The potential benefits and theoretical barriers for implementing a machine learning solution in practice are explained.

Prerequisites: ECE 152A with a minimum grade of C-.
ECE 157A
49 / 52 Closed
Machine Learning in Design and Test Automation
Li-C Wang 4.3
M W
17:00 PM - 18:15 PM
79.6% A
Image for ACM Leetcode Workshop Series
UCSB Association for Computing Machinery logo
UCSB Association for Computing Machinery
We are the largest computer science club at UCSB
Promoted

ACM Leetcode Workshop Series

Level up your Leetcode skill for SWE internship interview questions

Phelps Hall, Room 3526
Add to Google Calendar Open form