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  • MATRL 209C

    • Electron Microscopy II: Crystalline Materials . MATRL 209C

    Electron microscopy to study defect structures, elastic and inelastic scattering, kinematics theory of image contrast, bright and dark field imaging, two-beam conditions, contrast from imperfections, dynamical theory of diffraction and image contrast. Howie Whellan equations, dispersion surface.

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    Prerequisites: Consent of instructor.

    3

    Units

    Letter

    Grading

    1, 2, 3

    Passtime

    Graduate students only

    Level Limit

    Engineering

    College
    Instructors
    GIANOLA D S
    No info found
    Lecture
    PHELP1417
    T R
    12:30 PM - 13:45 PM
    0 / 25
    Enrollment Trends
    Past Enrollment Trends (2)
    Spring 2024 . Gianola D S
    ENGR21335
    T R
    12:30 PM - 13:45 PM
    Spring 2025 . Gianola D S
    PHELP1417
    T R
    12:30 PM - 13:45 PM
    Grading Trends (10)
    See All
    MATRL 209C Gianola D S Spring 2025 Total: 9
    MATRL 209C Gianola D S Spring 2024 Total: 6
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