Focuses on modern diffraction techniques from crystalline materials. High resolution x-ray diffraction. Analysis of epitaxial layers. X-ray scattering theory. Simulation of x-ray rocking curves. Analysis of thin films and multiple layers. Triple-axis x-ray diffractometry. Topography. Synchrotron techniques.

Prerequisites: Consent of instructor.

3

Units

Letter

Grading

1, 2, 3

Passtime

None

Level Limit

Engineering

College
SPECK J S
No info found
Spring 2024 . Speck J S
ENGR21335
M W F
11:00 AM - 12:15 PM
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