UCSBPlat . MATRL 209C

Electron Microscopy II: Crystalline Materials . MATRL 209C

Electron microscopy to study defect structures, elastic and inelastic scattering, kinematics theory of image contrast, bright and dark field imaging, two-beam conditions, contrast from imperfections, dynamical theory of diffraction and image contrast. Howie Whellan equations, dispersion surface.

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Prerequisites: Consent of instructor.

Units

Letter

Grading

1, 2, 3

Passtime

Graduate students only

Level Limit

Engineering

College

Instructors

GIANOLA D S

No info found

Lecture

PHELP1417

T R

12:30 PM - 13:45 PM

10 / 25

Enrollment Trends

Past Enrollment Trends (1)

Spring 2024 . Gianola D S

ENGR21335

T R

12:30 PM - 13:45 PM

Grading Trends (9)

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MATRL 209C Gianola D S Spring 2024 Total: 6

MATRL 209C Gianola D S Spring 2022 Total: 10

MATRL 200C

39 / 50 Enrolled

Structure Evolution

Van Der Ven A

M W F

09:00 AM - 10:50 AM

63.9% A

MATRL 206B

10 / 16 Enrolled

Fundamentals of Electronic Solids II

Krishnamoorth

T R

09:00 AM - 10:50 AM

95.1% A

MATRL 209B

4 / 20 Enrolled

X-Ray Diffraction II: Advanced Methods

Speck J S

M W

11:00 AM - 12:15 PM

92.6% A

MATRL 217

3 / 10 Enrolled

Molecular Beam Epitaxy and Band Gap Engineering

Christopher Palmstrom 2.8

M W

15:30 PM - 16:45 PM

78.2% A

MATRL 227

3 / 25 Enrolled

Metal-Organic Chemical Vapor Deposition

Steve Denbaars 3.8

M W

14:00 PM - 15:15 PM

84.6% A

MATRL 228

11 / 25 Enrolled

Computational Materials

Van De Walle

T R